Surfaces and Interfaces of Group-IV Semiconductors
GAI Zheng, ZHAO Ruguang, JI Hang, YANG Weisheng
(State Key Laboratory for Mesoscopic Physics, Department of Physics,
Peking University, Beijing, 100871)
Abstract:
Apparently, silicon-a group-IV semiconductor is the basis of the
multi-billion dollar industry of microelectronics. On the other hand,
our knowledge on almost every aspect of group-IV semiconductor surfaces
and interfaces is quite incomplete. Thereby, by means of scanning tunneling
microscopy, low-energy electron diffraction, and Auger electron
spectroscopy, a systematic investigation on the surfaces and interfaces
has been carrying out in a bid to gain a more comprehensive understanding
of them. In the investigation more effort has been put on germanium surfaces
because they have been, from the basic scientific point of view, unfairly
neglected. As a result, the atomic structure of the most stable high-
index surface Ge(113) and several others, such as Ge(103), (216), and (105),
has been determined. It has been found that not only the adatoms on Ge(111)
but also, surprisingly, the subsurface interstitial atoms of Ge(113) are
able to migrate at room temperature, and the activation energy of the
migrations has also been determined with a high precision. In the interface
aspect, the three common characteristics of the III/IV interfaces, the
prototype of group-IV interfaces, have been disclosed for the first time.